Graceful Degradation of Reconfigurable Scan Networks
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specifications are met and maintained. Scalable and flexible access to these instruments is offered by reconfigurable scan networks (RSNs), e.g. IEEE Std. 1687. As RSNs themselves can become faulty, there is a need to exclude and bypass faulty parts so that remaining instruments can be used. To avoid keeping t