External losses in photoemission from strongly correlated quasi-two-dimensional solids
Expressions are derived for photoemission, which allow experimental electron energy loss data to be used for estimating losses in photoemission. The derivation builds on new results for dielectric response and mean free paths of strongly correlated systems of two-dimensional layers. Numerical evaluations are made for Bi2Sr2CaCu2O8 (Bi2212) by using a parametrized loss function. The mean free path