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Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
The increasingtest data volume required to ensure high test quality when testinga System-on-Chip is becoming a problem since it (the test datavolume) must fit the ATE (Automatic Test Equipment) memory. In thispaper, we (1) define a test quality metric based on fault coverage,defect probability and number of applied test vectors, and (2) atest data truncation scheme. The truncation scheme combines
