Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering
The near monolayer depth resolution of medium energy ion scattering is utilized to develop a probe of the depth dependent composition of bimetallic nanoparticles supported on planar oxide supports. The approach fits spectra of scattered ion intensity versus ion energy at well-defined scattering angles taking into account the asymmetric line shape in such spectra and also the depth dependent loss p