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Test Scheduling for 3D Stacked ICs under Power Constraints

This paper addresses Test Application Time (TAT) reduction for core-based 3D Stacked ICs (SICs). Applying traditional test scheduling methods used for non-stacked chip testing where the same test schedule is applied both at wafer test and at final test to SICs, leads to unnecessarily high TAT. This is because the final test of 3D-SICs includes the testing of all the stacked chips. A key challenge

From Handicraft to High Technology - The Transformation of the Swedish forestry Vocational Educationa and Training 1940-1990

Forestry has been one of the major industries in the Swedish economy since the middle of the nineteenth century. During the second part of the twentieth century the industry went through powerful technological changes. Traditional handicraft methods were replaced by modern high technology. As for the forestry VET this meant a strong expansion during the 1950s and 1960s followed by integration into

Quality Enhancement for M-learning in Higher Education

Moving forward, higher education will face a variety of challenges, especially in 2020/2030, due to technological development and digitalization. Digitalization in society has grown, and society fosters digital citizenship to a greater extent. Students entering higher education today have grown up with the Internet and mobile devices. Daily life, schools, and work have also become more mobile beca