The potential of X-ray tomography and image analysis for interpretation of spectral induced polarization measurements
The spectral induced polarization (SIP) method is a promising method for many near surface applications, including characterization of contaminated soil. In this study, SIP measurements, high-resolution X-ray tomography and image analysis are combined to investigate clean and tetrachloroethylene (PCE) contaminated sand. This is the first known combination of these methods and the aim of this paper
