High-frequency/high-field electron paramagnetic resonance generalized spectroscopic ellipsometry characterization of Cr3+ in β-Ga2O3
Electron paramagnetic resonance of Cr3+ ions in β -Ga2O3 is investigated using terahertz spectroscopic ellipsometry under magnetic field sweeping, a technique that enables the polarization resolving capabilities of ellipsometry for magnetic resonance measurements. We employed a single-crystal chromium-doped β -Ga2O3 sample, grown by the Czochralski method, and performed ellipsometry measurements a