Exploring the Intrinsic Point Defects in Cesium Copper Halides
Cesium copper halides Cs3Cu2X5 (X = Cl, Br, and I) have attracted much attention for optoelectronic applications because of their self-trap excitons and high photoluminescence quantum yield. Intrinsic point defects play a critical role in the optoelectronic performance of these materials by affecting fundamental properties, such as carrier mobility, lifetime, and recombination rate. In this work,