Multifractal spectrums for volumes of spatial forms on surface of ZnxCd1−xTe–Si (111) heterostructures and estimation of the fractal surface energy
Multifractal (MF) analysis is used to describe volumes of spatial forms that are formed on the surface of thin layers of ZnxCd1−xTe solid solution grown on the Si (111) substrate. MF analysis is performed on the basis of AFM images of the solid solution surface. The parameters of the MF spectrums for the distribution of volumes of the spatial forms, which formed the surface relief, were found. On
