3D Strain Imaging of a Heterostructured GaInP/InP Nanowire Using Bragg Coherent Diffraction X-ray Imaging : Implications for Optoelectronic Devices
Imaging the strain in nanoscale heterostructures is challenging since it requires a combination of high strain sensitivity and spatial resolution. Here, we show that three-dimensional (3D) Bragg coherent diffraction imaging (BCDI) can be used to image the strain in a single InP segment within an axially heterostructured GaInP-InP nanowire. We use a 350 nm-diameter X-ray beam, which is smaller than
