Characterization of the response function of a Si(Li) detector using an absorber technique
The non-Gaussian response function of a Si(Li) detector has been measured for characteristic Kα X-rays in the energy interval 1.5-8.6 keV using an absorber technique. The method is based on the different response to an attenuating absorber placed in front of the detector for the detector tail as compared to fully absorbed photons in the same position in the spectrum. The shape of the tail of a Kα