Characterization of the structure of mesoporous thin films grown at the air/water interface using X-ray surface techniques
Grazing incidence X-ray diffraction (GIKD) and X-ray reflectivity have been used in situ to study the structure of surfactant-templated silica films grown at the air/water interface at different depths in the film. The results confirm that cylindrical silica-encased surfactant micelles are predominantly organized into a two-dimensional hexagonal structure, with the long axis parallel to the surfac
