Structure and Composition of Isolated Core-Shell (In,Ga) N/GaN Rods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy
Nanofocus x-ray diffraction is used to investigate the structure and local strain field of an isolated (In,Ga)N/GaN core-shell microrod. Because the high spatial resolution of the x-ray beam is only 80×90 nm2, we are able to investigate several distinct volumes on one individual side facet. Here, we find a drastic increase in thickness of the outer GaN shell along the rod height. Additionally, we
