Adaptive Execution Assistance for Multiplexed Fault-Tolerant Chip Multiprocessors
Relentless scaling of CMOS fabrication technology has made contemporary integrated circuits increasingly susceptible to transient faults, wearout-related permanent faults, intermittent faults and process variations. Therefore, mechanisms to mitigate the effects of decreased reliability are expected to become essential components of future general purpose microprocessors. In this paper, we introdu
