A low-energy electron microscopy and x-ray photo-emission electron microscopy study of Li intercalated into graphene on SiC(0001)
The effects induced by the deposition of Li on 1 and 0 ML graphene grown on SiC(0001) and after subsequent heating were investigated using low-energy electron microscopy (LEEM) and x-ray photo-emission electron microscopy (XPEEM). For 1 ML samples, the collected photoelectron angular distribution patterns showed the presence of single pi-cones at the six equivalent K-points in the Brillouin zone b
