A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
The increasingcost for System-on-Chip (SOC) testing is mainly due to the hugetest data volumes that lead to long test application time andrequire large automatic test equipment (ATE) memory. Testcompression and test sharing have been proposed to reduce the testdata volume, while test infrastructure and concurrent testscheduling have been developed to reduce the test application time.In this work w
