Fault management in an IEEE P1687 (IJTAG) environment
To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor tec