Photoelectron spectroscopy study of Ag/Si(111)root 3X root 3 and the effect of additional Ag adatoms
High-resolution core-level spectroscopy has been applied to the Ag/Si(111)root3xroot3 surface. The Si 2p line shape is found to depend critically on the presence of additional Ag adatoms on the surface. A significant broadening caused by the surplus of Ag atoms could be eliminated by careful annealing. The resulting Si 2p spectra are significantly sharper than any published data for this or other
