Locating nanowire heterostructures by electron beam induced current
Electron beam induced current ( EBIC) in a scanning electron microscope ( SEM) was used to identify the positions of heterostructures in InAs/InP nanowires. Composite SEM and EBIC images were used to locate heterostructures and quantum dots in the nanowires, and used in subsequent electron beam lithography to align local gate electrodes to these quantum dots. This has made it possible to use indiv