Nanowire growth and dopants studied by cross-sectional scanning tunnelling microscopy
Using a crystalline embedding scheme it has recently become possible to study free-standing III - V nanowires with cross-sectional scanning tunnelling microscopy (XSTM). In the present paper we discuss how this novel method can be used for direct atomically resolved imaging of the interior of nanowires. We will focus in particular on two areas where this method provides unique possibilities. First